TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_10_34
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-014-011-10 | FUSED_ID : 6359364768406495418
  IC_TEMP :  -53.80 | VDDM : 1122.50 | AUX_INT :   -8.14 | CsaBias :   75.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27825e-03 / 2
  ADC_P0  : -8.14228e-03 ± 2.42180e-02
  ADC_P1  : 8.40347e-03 ± 5.93790e-04
  ADC_P2  : -6.06480e-06 ± 2.87949e-06
  CSA_Chi2/NDF : 1.04554e-04 / 2
  CSA_P0  : 6.00576e-02 ± 6.82012e-03
  CSA_P1  : 9.96828e-03 ± 5.13847e-04
  CSA_P2  : -4.52198e-05 ± 7.82528e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [70]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [41, 78, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2172', '1.800', '0.1735', '1.800', '0.0870', '7.000', '0.7075', 1, 1, 1, 1, 1727284234.727132]
VI_after__Init : ['1.201', '0.2172', '1.800', '0.1734', '1.801', '0.0813', '7.000', '0.7072', 1, 1, 1, 1, 1727284242.8795352]
VI_at__the_End : ['1.201', '0.5015', '1.800', '0.1422', '1.808', '0.1109', '7.000', '0.7080', 1, 1, 1, 1, 1727284307.048599]