TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_12_12
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-014-012-10 | FUSED_ID : 6359364768406495434
  IC_TEMP :  -52.16 | VDDM : 1125.97 | AUX_INT :   -6.33 | CsaBias :   88.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.89422e-04 / 2
  ADC_P0  : -6.32948e-03 ± 1.90053e-02
  ADC_P1  : 7.93881e-03 ± 4.46938e-04
  ADC_P2  : -5.14113e-06 ± 2.07444e-06
  CSA_Chi2/NDF : 1.17907e-04 / 2
  CSA_P0  : 5.81425e-02 ± 7.24257e-03
  CSA_P1  : 9.91976e-03 ± 5.45676e-04
  CSA_P2  : -4.43604e-05 ± 8.30999e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [8, 40]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1455', '1.800', '0.1293', '1.800', '0.0836', '7.000', '0.7070', 1, 1, 1, 1, 1727284331.8226998]
VI_after__Init : ['1.201', '0.1455', '1.800', '0.1293', '1.801', '0.0782', '7.000', '0.7071', 1, 1, 1, 1, 1727284340.0080647]
VI_at__the_End : ['1.201', '0.5038', '1.800', '0.1365', '1.802', '0.1116', '7.000', '0.7077', 1, 1, 1, 1, 1727284402.7592943]