TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_13_49
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-014-013-10 | FUSED_ID : 6359364768406495450
  IC_TEMP :  -50.70 | VDDM : 1137.98 | AUX_INT : -109.86 | CsaBias :    2.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10558e-03 / 2
  ADC_P0  : -1.09864e-01 ± 2.76080e-02
  ADC_P1  : 9.49631e-03 ± 6.37190e-04
  ADC_P2  : -9.86154e-06 ± 2.87990e-06
  CSA_Chi2/NDF : 6.61673e-05 / 2
  CSA_P0  : 5.92387e-02 ± 5.42555e-03
  CSA_P1  : 9.18483e-03 ± 4.08776e-04
  CSA_P2  : -3.56522e-05 ± 6.22518e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [28]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3446', '1.800', '0.1344', '1.800', '0.0952', '7.000', '0.7070', 1, 1, 1, 1, 1727284429.11527]
VI_after__Init : ['1.201', '0.3447', '1.800', '0.1345', '1.800', '0.0895', '7.000', '0.7071', 1, 1, 1, 1, 1727284437.893615]
VI_at__the_End : ['1.201', '0.4935', '1.800', '0.1348', '1.805', '0.1113', '7.000', '0.7079', 1, 1, 1, 1, 1727284501.391705]