TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_15_27
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-014-014-10 | FUSED_ID : 6359364768406495466
  IC_TEMP :  -50.48 | VDDM : 1123.84 | AUX_INT :   -8.50 | CsaBias :   80.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28429e-03 / 2
  ADC_P0  : -8.50271e-03 ± 2.42588e-02
  ADC_P1  : 8.12649e-03 ± 5.71277e-04
  ADC_P2  : -5.82220e-06 ± 2.66326e-06
  CSA_Chi2/NDF : 7.25381e-05 / 2
  CSA_P0  : 5.93735e-02 ± 5.68075e-03
  CSA_P1  : 9.59523e-03 ± 4.28003e-04
  CSA_P2  : -3.96013e-05 ± 6.51798e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [38, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [10, 68]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3152', '1.800', '0.1592', '1.800', '0.0865', '7.000', '0.7068', 1, 1, 1, 1, 1727284527.168701]
VI_after__Init : ['1.201', '0.3154', '1.800', '0.1592', '1.801', '0.0807', '7.000', '0.7069', 1, 1, 1, 1, 1727284535.9330273]
VI_at__the_End : ['1.201', '0.5027', '1.800', '0.1387', '1.799', '0.1099', '7.000', '0.7076', 1, 1, 1, 1, 1727284598.6773095]