TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_17_05
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-014-015-10 | FUSED_ID : 6359364768406495482
  IC_TEMP :  -55.23 | VDDM : 1128.48 | AUX_INT :   -6.19 | CsaBias :   77.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.98617e-04 / 2
  ADC_P0  : -6.18887e-03 ± 1.90570e-02
  ADC_P1  : 8.45021e-03 ± 4.62653e-04
  ADC_P2  : -7.02764e-06 ± 2.20035e-06
  CSA_Chi2/NDF : 7.97496e-05 / 2
  CSA_P0  : 5.86669e-02 ± 5.95644e-03
  CSA_P1  : 9.54462e-03 ± 4.48774e-04
  CSA_P2  : -3.95908e-05 ± 6.83430e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [50, 62]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [2, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1437', '1.800', '0.1435', '1.799', '0.0827', '7.000', '0.7069', 1, 1, 1, 1, 1727284625.176094]
VI_after__Init : ['1.201', '0.1438', '1.800', '0.1435', '1.800', '0.0775', '7.000', '0.7069', 1, 1, 1, 1, 1727284633.3075953]
VI_at__the_End : ['1.201', '0.4997', '1.800', '0.1370', '1.800', '0.1129', '7.000', '0.7076', 1, 1, 1, 1, 1727284696.3297548]