TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_18_42
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-014-016-13 | FUSED_ID : 6359364768406495501
  IC_TEMP :  -53.16 | VDDM : 1118.06 | AUX_INT :  -73.89 | CsaBias :   35.81
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72690e-03 / 2
  ADC_P0  : -7.38852e-02 ± 3.20112e-02
  ADC_P1  : 9.24890e-03 ± 7.58058e-04
  ADC_P2  : -8.97484e-06 ± 3.53299e-06
  CSA_Chi2/NDF : 8.97095e-05 / 2
  CSA_P0  : 5.76697e-02 ± 6.31745e-03
  CSA_P1  : 9.66092e-03 ± 4.75974e-04
  CSA_P2  : -4.16701e-05 ± 7.24852e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [45, 55]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2256', '1.800', '0.1427', '1.800', '0.0868', '7.000', '0.7073', 1, 1, 1, 1, 1727284722.1587214]
VI_after__Init : ['1.202', '0.2257', '1.800', '0.1428', '1.801', '0.0814', '7.000', '0.7071', 1, 1, 1, 1, 1727284730.9240904]
VI_at__the_End : ['1.201', '0.4977', '1.800', '0.1375', '1.800', '0.1124', '7.000', '0.7077', 1, 1, 1, 1, 1727284794.3632307]