TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_21_58
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-014-018-13 | FUSED_ID : 6359364768406495533
  IC_TEMP :  -57.90 | VDDM : 1125.91 | AUX_INT :   -8.19 | CsaBias :   88.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12712e-03 / 2
  ADC_P0  : -8.19368e-03 ± 2.26858e-02
  ADC_P1  : 8.11159e-03 ± 5.28148e-04
  ADC_P2  : -6.15633e-06 ± 2.42761e-06
  CSA_Chi2/NDF : 1.02053e-04 / 2
  CSA_P0  : 5.98554e-02 ± 6.73807e-03
  CSA_P1  : 9.91840e-03 ± 5.07665e-04
  CSA_P2  : -4.47111e-05 ± 7.73113e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [33, 79, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3360', '1.800', '0.1387', '1.800', '0.0917', '7.000', '0.7074', 1, 1, 1, 1, 1727284918.2877736]
VI_after__Init : ['1.201', '0.3365', '1.800', '0.1388', '1.800', '0.0865', '7.000', '0.7069', 1, 1, 1, 1, 1727284926.553076]
VI_at__the_End : ['1.201', '0.5062', '1.800', '0.1384', '1.801', '0.1121', '7.000', '0.7080', 1, 1, 1, 1, 1727284989.736288]