TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_23_36
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-014-019-13 | FUSED_ID : 6359364768406495549
  IC_TEMP :  -50.25 | VDDM : 1129.08 | AUX_INT :   -8.79 | CsaBias :   88.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40624e-03 / 2
  ADC_P0  : -8.79265e-03 ± 2.54291e-02
  ADC_P1  : 8.15407e-03 ± 6.05832e-04
  ADC_P2  : -5.51280e-06 ± 2.86522e-06
  CSA_Chi2/NDF : 6.82838e-05 / 2
  CSA_P0  : 5.87927e-02 ± 5.51164e-03
  CSA_P1  : 9.49071e-03 ± 4.15263e-04
  CSA_P2  : -3.81684e-05 ± 6.32396e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [70]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [70, 79]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2184', '1.800', '0.1540', '1.800', '0.0854', '7.000', '0.7078', 1, 1, 1, 1, 1727285016.1243138]
VI_after__Init : ['1.201', '0.2184', '1.800', '0.1539', '1.801', '0.0781', '7.000', '0.7074', 1, 1, 1, 1, 1727285024.942547]
VI_at__the_End : ['1.201', '0.5022', '1.800', '0.1368', '1.799', '0.1109', '7.000', '0.7082', 1, 1, 1, 1, 1727285087.9117773]