TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_25_14
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-014-020-13 | FUSED_ID : 6359364768406495565
  IC_TEMP :  -51.73 | VDDM : 1121.80 | AUX_INT :   -7.97 | CsaBias :   83.49
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11685e-03 / 2
  ADC_P0  : -7.97051e-03 ± 2.26030e-02
  ADC_P1  : 8.38363e-03 ± 5.49350e-04
  ADC_P2  : -6.25623e-06 ± 2.63955e-06
  CSA_Chi2/NDF : 7.80296e-05 / 2
  CSA_P0  : 6.05081e-02 ± 5.89186e-03
  CSA_P1  : 9.43383e-03 ± 4.43909e-04
  CSA_P2  : -3.74975e-05 ± 6.76021e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2264', '1.800', '0.1730', '1.799', '0.0849', '7.000', '0.7072', 1, 1, 1, 1, 1727285114.5387187]
VI_after__Init : ['1.201', '0.2264', '1.800', '0.1730', '1.801', '0.0796', '7.000', '0.7073', 1, 1, 1, 1, 1727285122.5631316]
VI_at__the_End : ['1.201', '0.5057', '1.800', '0.1400', '1.800', '0.1104', '7.000', '0.7081', 1, 1, 1, 1, 1727285182.7634947]