TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_28_30
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-014-022-13 | FUSED_ID : 6359364768406495597
  IC_TEMP :  -53.69 | VDDM : 1118.90 | AUX_INT :   -7.96 | CsaBias :   80.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23313e-03 / 2
  ADC_P0  : -7.96132e-03 ± 2.37882e-02
  ADC_P1  : 8.08351e-03 ± 5.63095e-04
  ADC_P2  : -5.51292e-06 ± 2.63688e-06
  CSA_Chi2/NDF : 9.14428e-05 / 2
  CSA_P0  : 5.81678e-02 ± 6.37818e-03
  CSA_P1  : 9.69363e-03 ± 4.80550e-04
  CSA_P2  : -4.03847e-05 ± 7.31821e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [73, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [62]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2430', '1.800', '0.1465', '1.800', '0.0925', '7.000', '0.7072', 1, 1, 1, 1, 1727285309.689867]
VI_after__Init : ['1.201', '0.2430', '1.800', '0.1465', '1.800', '0.0868', '7.000', '0.7074', 1, 1, 1, 1, 1727285318.5100732]
VI_at__the_End : ['1.201', '0.5031', '1.800', '0.1393', '1.802', '0.1113', '7.000', '0.7080', 1, 1, 1, 1, 1727285381.7681851]