TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_30_07
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-014-023-13 | FUSED_ID : 6359364768406495613
  IC_TEMP :  -50.24 | VDDM : 1127.85 | AUX_INT :   -6.74 | CsaBias :   99.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03770e-03 / 2
  ADC_P0  : -6.73922e-03 ± 2.18600e-02
  ADC_P1  : 7.67849e-03 ± 5.06791e-04
  ADC_P2  : -4.16566e-06 ± 2.32652e-06
  CSA_Chi2/NDF : 6.03857e-05 / 2
  CSA_P0  : 5.88454e-02 ± 5.18310e-03
  CSA_P1  : 9.25127e-03 ± 3.90509e-04
  CSA_P2  : -3.39704e-05 ± 5.94699e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [5, 60, 68]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4620', '1.800', '0.1534', '1.800', '0.0955', '7.000', '0.7087', 1, 1, 1, 1, 1727285407.399346]
VI_after__Init : ['1.201', '0.4622', '1.800', '0.1537', '1.800', '0.0884', '7.000', '0.7075', 1, 1, 1, 1, 1727285415.4676733]
VI_at__the_End : ['1.201', '0.5041', '1.800', '0.1368', '1.801', '0.1107', '7.000', '0.7082', 1, 1, 1, 1, 1727285478.8118796]