TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_10_39
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-015-004-07 | FUSED_ID : 6359364768406499399
  IC_TEMP :  -57.58 | VDDM : 1123.85 | AUX_INT :   -7.56 | CsaBias :   85.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31509e-03 / 2
  ADC_P0  : -7.55928e-03 ± 2.45922e-02
  ADC_P1  : 8.52187e-03 ± 6.18984e-04
  ADC_P2  : -5.92716e-06 ± 3.07763e-06
  CSA_Chi2/NDF : 1.21044e-04 / 2
  CSA_P0  : 5.86480e-02 ± 7.33828e-03
  CSA_P1  : 9.50021e-03 ± 5.52886e-04
  CSA_P2  : -3.98350e-05 ± 8.41981e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [58, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [49]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3421', '1.800', '0.1968', '1.800', '0.0885', '7.000', '0.7079', 1, 1, 1, 1, 1727287839.2545805]
VI_after__Init : ['1.202', '0.3422', '1.800', '0.1969', '1.800', '0.0829', '7.000', '0.7078', 1, 1, 1, 1, 1727287847.2669764]
VI_at__the_End : ['1.202', '0.4956', '1.800', '0.1373', '1.804', '0.1114', '7.000', '0.7084', 1, 1, 1, 1, 1727287908.1022432]