TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_09_02
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-015-005-07 | FUSED_ID : 6359364768406499415
  IC_TEMP :  -58.93 | VDDM : 1122.19 | AUX_INT :   -7.12 | CsaBias :   70.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11024e-03 / 2
  ADC_P0  : -7.12450e-03 ± 2.25688e-02
  ADC_P1  : 8.64401e-03 ± 5.75024e-04
  ADC_P2  : -6.22595e-06 ± 2.89125e-06
  CSA_Chi2/NDF : 1.54756e-04 / 2
  CSA_P0  : 5.78660e-02 ± 8.29748e-03
  CSA_P1  : 1.02479e-02 ± 6.25156e-04
  CSA_P2  : -4.88078e-05 ± 9.52038e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [97, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.5189', '1.800', '0.1565', '1.800', '0.1036', '7.000', '0.7079', 1, 1, 1, 1, 1727287741.8150558]
VI_after__Init : ['1.201', '0.5198', '1.800', '0.1567', '1.800', '0.0981', '7.000', '0.7077', 1, 1, 1, 1, 1727287749.7914302]
VI_at__the_End : ['1.201', '0.5054', '1.800', '0.1429', '1.799', '0.1134', '7.000', '0.7088', 1, 1, 1, 1, 1727287814.6883543]