TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_02_30
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-015-009-07 | FUSED_ID : 6359364768406499479
  IC_TEMP :  -54.50 | VDDM : 1127.85 | AUX_INT :  -34.72 | CsaBias :   59.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39774e-03 / 2
  ADC_P0  : -3.47211e-02 ± 2.67457e-02
  ADC_P1  : 8.66211e-03 ± 6.48226e-04
  ADC_P2  : -6.66832e-06 ± 3.10434e-06
  CSA_Chi2/NDF : 1.20000e-04 / 2
  CSA_P0  : 5.81932e-02 ± 7.30656e-03
  CSA_P1  : 9.77941e-03 ± 5.50497e-04
  CSA_P2  : -4.39021e-05 ± 8.38341e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [86]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2342', '1.800', '0.1359', '1.800', '0.0882', '7.000', '0.7077', 1, 1, 1, 1, 1727287350.064093]
VI_after__Init : ['1.201', '0.2342', '1.800', '0.1359', '1.800', '0.0827', '7.000', '0.7078', 1, 1, 1, 1, 1727287358.0854516]
VI_at__the_End : ['1.202', '0.4974', '1.800', '0.1358', '1.800', '0.1128', '7.000', '0.7083', 1, 1, 1, 1, 1727287420.6076941]