TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_57_37
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-015-012-07 | FUSED_ID : 6359364768406499527
  IC_TEMP :  -48.65 | VDDM : 1112.35 | AUX_INT :   -8.68 | CsaBias :   87.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20993e-03 / 2
  ADC_P0  : -8.68176e-03 ± 2.35602e-02
  ADC_P1  : 8.11247e-03 ± 5.58263e-04
  ADC_P2  : -5.40949e-06 ± 2.63073e-06
  CSA_Chi2/NDF : 7.58806e-05 / 2
  CSA_P0  : 5.82470e-02 ± 5.81016e-03
  CSA_P1  : 9.48277e-03 ± 4.37753e-04
  CSA_P2  : -3.78916e-05 ± 6.66646e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [41]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [16, 51]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3680', '1.800', '0.1468', '1.800', '0.0919', '7.000', '0.7076', 1, 1, 1, 1, 1727287057.393441]
VI_after__Init : ['1.202', '0.3680', '1.800', '0.1468', '1.800', '0.0863', '7.000', '0.7079', 1, 1, 1, 1, 1727287065.490871]
VI_at__the_End : ['1.201', '0.5024', '1.800', '0.1370', '1.803', '0.1110', '7.000', '0.7085', 1, 1, 1, 1, 1727287125.3242738]