TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_54_22
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-015-014-07 | FUSED_ID : 6359364768406499559
  IC_TEMP :  -57.88 | VDDM : 1123.25 | AUX_INT :   -7.23 | CsaBias :   76.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28638e-03 / 2
  ADC_P0  : -7.22967e-03 ± 2.42948e-02
  ADC_P1  : 8.41081e-03 ± 5.95674e-04
  ADC_P2  : -6.12031e-06 ± 2.88862e-06
  CSA_Chi2/NDF : 1.29930e-04 / 2
  CSA_P0  : 5.75789e-02 ± 7.60287e-03
  CSA_P1  : 9.98717e-03 ± 5.72822e-04
  CSA_P2  : -4.90209e-05 ± 8.72339e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [61, 72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4132', '1.800', '0.1947', '1.799', '0.0984', '7.000', '0.7077', 1, 1, 1, 1, 1727286862.076572]
VI_after__Init : ['1.202', '0.4132', '1.800', '0.1947', '1.800', '0.0925', '7.000', '0.7078', 1, 1, 1, 1, 1727286870.9698455]
VI_at__the_End : ['1.202', '0.4892', '1.800', '0.1384', '1.800', '0.1132', '7.000', '0.7084', 1, 1, 1, 1, 1727286935.8418312]