TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_52_44
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-015-015-07 | FUSED_ID : 6359364768406499575
  IC_TEMP :  -54.98 | VDDM : 1124.55 | AUX_INT :   -7.80 | CsaBias :   80.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04969e-03 / 2
  ADC_P0  : -7.79942e-03 ± 2.19154e-02
  ADC_P1  : 8.05843e-03 ± 5.14391e-04
  ADC_P2  : -5.64355e-06 ± 2.38748e-06
  CSA_Chi2/NDF : 7.79867e-05 / 2
  CSA_P0  : 5.92830e-02 ± 5.89023e-03
  CSA_P1  : 9.56186e-03 ± 4.43787e-04
  CSA_P2  : -3.92229e-05 ± 6.75835e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [39]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2418', '1.800', '0.1637', '1.800', '0.0938', '7.000', '0.7075', 1, 1, 1, 1, 1727286764.363927]
VI_after__Init : ['1.202', '0.2419', '1.800', '0.1637', '1.800', '0.0887', '7.000', '0.7077', 1, 1, 1, 1, 1727286772.4074082]
VI_at__the_End : ['1.202', '0.5006', '1.800', '0.1377', '1.800', '0.1118', '7.000', '0.7083', 1, 1, 1, 1, 1727286837.5834565]