TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_51_06
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-015-016-00 | FUSED_ID : 6359364768406499584
  IC_TEMP :  -53.81 | VDDM : 1127.90 | AUX_INT :   -6.97 | CsaBias :   81.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.50239e-04 / 2
  ADC_P0  : -6.96726e-03 ± 1.84781e-02
  ADC_P1  : 8.13082e-03 ± 4.34931e-04
  ADC_P2  : -6.00081e-06 ± 2.02173e-06
  CSA_Chi2/NDF : 6.96081e-05 / 2
  CSA_P0  : 5.79044e-02 ± 5.56483e-03
  CSA_P1  : 9.17114e-03 ± 4.19270e-04
  CSA_P2  : -3.49044e-05 ± 6.38499e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [3, 84]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3061', '1.800', '0.1492', '1.799', '0.0835', '7.000', '0.7079', 1, 1, 1, 1, 1727286666.3516052]
VI_after__Init : ['1.201', '0.3065', '1.800', '0.1492', '1.800', '0.0782', '7.000', '0.7078', 1, 1, 1, 1, 1727286674.4109397]
VI_at__the_End : ['1.201', '0.4928', '1.800', '0.1387', '1.800', '0.1116', '7.000', '0.7085', 1, 1, 1, 1, 1727286733.1584008]