TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_49_28
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-015-017-00 | FUSED_ID : 6359364768406499600
  IC_TEMP :  -55.38 | VDDM : 1123.38 | AUX_INT :   -8.13 | CsaBias :   88.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06249e-03 / 2
  ADC_P0  : -8.12789e-03 ± 2.20325e-02
  ADC_P1  : 8.10640e-03 ± 5.14477e-04
  ADC_P2  : -5.98083e-06 ± 2.37726e-06
  CSA_Chi2/NDF : 7.12951e-05 / 2
  CSA_P0  : 5.90448e-02 ± 5.63186e-03
  CSA_P1  : 8.96488e-03 ± 4.24320e-04
  CSA_P2  : -3.41242e-05 ± 6.46190e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [16, 50, 78]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2359', '1.800', '0.1234', '1.800', '0.0852', '7.000', '0.7077', 1, 1, 1, 1, 1727286568.1587458]
VI_after__Init : ['1.202', '0.2361', '1.800', '0.1234', '1.800', '0.0796', '7.000', '0.7076', 1, 1, 1, 1, 1727286576.3025098]
VI_at__the_End : ['1.201', '0.4854', '1.800', '0.1356', '1.800', '0.1117', '7.000', '0.7083', 1, 1, 1, 1, 1727286635.1279576]