TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_47_49
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-015-018-00 | FUSED_ID : 6359364768406499616
  IC_TEMP :  -51.58 | VDDM : 1124.55 | AUX_INT :   -7.80 | CsaBias :   80.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04969e-03 / 2
  ADC_P0  : -7.79942e-03 ± 2.19154e-02
  ADC_P1  : 8.05843e-03 ± 5.14391e-04
  ADC_P2  : -5.64355e-06 ± 2.38748e-06
  CSA_Chi2/NDF : 8.43635e-05 / 2
  CSA_P0  : 5.82533e-02 ± 6.12632e-03
  CSA_P1  : 9.59307e-03 ± 4.61574e-04
  CSA_P2  : -4.03368e-05 ± 7.02923e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [3, 33, 50]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [1, 41, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4962', '1.800', '0.1333', '1.800', '0.0956', '7.000', '0.7076', 1, 1, 1, 1, 1727286469.6196783]
VI_after__Init : ['1.201', '0.4966', '1.800', '0.1333', '1.800', '0.0898', '7.000', '0.7076', 1, 1, 1, 1, 1727286477.669046]
VI_at__the_End : ['1.202', '0.4985', '1.800', '0.1367', '1.800', '0.1116', '7.000', '0.7083', 1, 1, 1, 1, 1727286542.5070605]