TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_36_40
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-015-025-00 | FUSED_ID : 6359364768406499728
  IC_TEMP :  -57.46 | VDDM : 1117.89 | AUX_INT :   -8.61 | CsaBias :   88.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28976e-03 / 2
  ADC_P0  : -8.61256e-03 ± 2.43104e-02
  ADC_P1  : 8.13141e-03 ± 5.72493e-04
  ADC_P2  : -5.83500e-06 ± 2.66893e-06
  CSA_Chi2/NDF : 7.40590e-05 / 2
  CSA_P0  : 5.83302e-02 ± 5.73999e-03
  CSA_P1  : 9.44652e-03 ± 4.32467e-04
  CSA_P2  : -3.81899e-05 ± 6.58596e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [15, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [30]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3920', '1.800', '0.1532', '1.800', '0.0970', '7.000', '0.7076', 1, 1, 1, 1, 1727285799.8032894]
VI_after__Init : ['1.201', '0.3917', '1.800', '0.1531', '1.800', '0.0912', '7.000', '0.7078', 1, 1, 1, 1, 1727285807.9516468]
VI_at__the_End : ['1.201', '0.4987', '1.800', '0.1356', '1.800', '0.1128', '7.000', '0.7082', 1, 1, 1, 1, 1727285869.6598296]