TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_12_17
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-016-006-15 | FUSED_ID : 6359364768406503535
  IC_TEMP :  -55.61 | VDDM : 1129.96 | AUX_INT :   -9.47 | CsaBias :   95.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35821e-03 / 2
  ADC_P0  : -9.46921e-03 ± 2.49440e-02
  ADC_P1  : 8.15255e-03 ± 5.87951e-04
  ADC_P2  : -5.70096e-06 ± 2.75804e-06
  CSA_Chi2/NDF : 8.37949e-05 / 2
  CSA_P0  : 5.83040e-02 ± 6.10564e-03
  CSA_P1  : 8.98709e-03 ± 4.60016e-04
  CSA_P2  : -3.06987e-05 ± 7.00550e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [1, 61, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [104, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1099', '1.800', '0.1498', '1.800', '0.0821', '7.000', '0.7078', 1, 1, 1, 1, 1727287936.750101]
VI_after__Init : ['1.202', '0.1099', '1.800', '0.1498', '1.800', '0.0765', '7.000', '0.7079', 1, 1, 1, 1, 1727287945.4225252]
VI_at__the_End : ['1.201', '0.4979', '1.800', '0.1372', '1.800', '0.1110', '7.000', '0.7085', 1, 1, 1, 1, 1727288004.5479326]