TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_13_54
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-016-007-15 | FUSED_ID : 6359364768406503551
  IC_TEMP :  -55.54 | VDDM : 1122.30 | AUX_INT :   -8.07 | CsaBias :   93.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03678e-03 / 2
  ADC_P0  : -8.07041e-03 ± 2.17801e-02
  ADC_P1  : 7.91194e-03 ± 5.02849e-04
  ADC_P2  : -5.29455e-06 ± 2.30187e-06
  CSA_Chi2/NDF : 9.47346e-05 / 2
  CSA_P0  : 5.95640e-02 ± 6.49197e-03
  CSA_P1  : 9.44228e-03 ± 4.89123e-04
  CSA_P2  : -3.72888e-05 ± 7.44877e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [60, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [85, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4452', '1.800', '0.1516', '1.800', '0.0938', '7.000', '0.7079', 1, 1, 1, 1, 1727288034.5766222]
VI_after__Init : ['1.202', '0.4455', '1.800', '0.1516', '1.800', '0.0884', '7.000', '0.7078', 1, 1, 1, 1, 1727288042.5989282]
VI_at__the_End : ['1.202', '0.5030', '1.800', '0.1352', '1.800', '0.1121', '7.000', '0.7085', 1, 1, 1, 1, 1727288105.0691986]