TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_17_10
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-016-009-15 | FUSED_ID : 6359364768406503583
  IC_TEMP :  -56.09 | VDDM : 1113.85 | AUX_INT :   -9.10 | CsaBias :   92.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45843e-03 / 2
  ADC_P0  : -9.10167e-03 ± 2.58716e-02
  ADC_P1  : 7.88912e-03 ± 5.90906e-04
  ADC_P2  : -5.44170e-06 ± 2.67521e-06
  CSA_Chi2/NDF : 1.01120e-04 / 2
  CSA_P0  : 5.64079e-02 ± 6.70720e-03
  CSA_P1  : 9.25161e-03 ± 5.05339e-04
  CSA_P2  : -3.85074e-05 ± 7.69571e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [102, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2544', '1.800', '0.1627', '1.800', '0.0903', '7.000', '0.7079', 1, 1, 1, 1, 1727288229.769592]
VI_after__Init : ['1.202', '0.2544', '1.800', '0.1626', '1.800', '0.0847', '7.000', '0.7082', 1, 1, 1, 1, 1727288238.4619334]
VI_at__the_End : ['1.202', '0.4841', '1.800', '0.1307', '1.800', '0.1130', '7.000', '0.7086', 1, 1, 1, 1, 1727288297.6095016]