TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_18_47
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-016-010-15 | FUSED_ID : 6359364768406503599
  IC_TEMP :  -50.84 | VDDM : 1127.31 | AUX_INT :   -5.85 | CsaBias :   86.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.37252e-04 / 2
  ADC_P0  : -5.84583e-03 ± 1.95692e-02
  ADC_P1  : 7.79826e-03 ± 4.50815e-04
  ADC_P2  : -5.19266e-06 ± 2.04041e-06
  CSA_Chi2/NDF : 6.46835e-05 / 2
  CSA_P0  : 5.76817e-02 ± 5.36438e-03
  CSA_P1  : 8.90333e-03 ± 4.04167e-04
  CSA_P2  : -3.15289e-05 ± 6.15499e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [60, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3092', '1.800', '0.1498', '1.800', '0.0934', '7.000', '0.7076', 1, 1, 1, 1, 1727288327.540159]
VI_after__Init : ['1.202', '0.3094', '1.800', '0.1498', '1.800', '0.0877', '7.000', '0.7080', 1, 1, 1, 1, 1727288335.5785522]
VI_at__the_End : ['1.202', '0.4905', '1.800', '0.1329', '1.801', '0.1116', '7.000', '0.7086', 1, 1, 1, 1, 1727288403.8363092]