TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_20_25
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-016-011-15 | FUSED_ID : 6359364768406503615
  IC_TEMP :  -51.58 | VDDM : 1132.17 | AUX_INT :   -6.90 | CsaBias :   90.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.64831e-04 / 2
  ADC_P0  : -6.90112e-03 ± 2.10333e-02
  ADC_P1  : 8.15965e-03 ± 5.06261e-04
  ADC_P2  : -5.49943e-06 ± 2.40667e-06
  CSA_Chi2/NDF : 5.98340e-05 / 2
  CSA_P0  : 5.76497e-02 ± 5.15937e-03
  CSA_P1  : 8.89529e-03 ± 3.88721e-04
  CSA_P2  : -3.12723e-05 ± 5.91976e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [33]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [14, 68]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3099', '1.800', '0.1502', '1.800', '0.0954', '7.000', '0.7090', 1, 1, 1, 1, 1727288425.4026644]
VI_after__Init : ['1.202', '0.3100', '1.800', '0.1502', '1.800', '0.0879', '7.000', '0.7079', 1, 1, 1, 1, 1727288433.569984]
VI_at__the_End : ['1.202', '0.4903', '1.799', '0.1361', '1.799', '0.1106', '7.000', '0.7086', 1, 1, 1, 1, 1727288498.8950434]