TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_22_03
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-016-012-15 | FUSED_ID : 6359364768406503631
  IC_TEMP :  -54.06 | VDDM : 1120.72 | AUX_INT :   -9.37 | CsaBias :   76.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42837e-03 / 2
  ADC_P0  : -9.37369e-03 ± 2.56183e-02
  ADC_P1  : 7.86564e-03 ± 5.88633e-04
  ADC_P2  : -5.01583e-06 ± 2.69291e-06
  CSA_Chi2/NDF : 1.08707e-04 / 2
  CSA_P0  : 5.78538e-02 ± 6.95427e-03
  CSA_P1  : 9.30346e-03 ± 5.23954e-04
  CSA_P2  : -3.86759e-05 ± 7.97919e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2040', '1.800', '0.1341', '1.800', '0.0868', '7.000', '0.7083', 1, 1, 1, 1, 1727288523.2031937]
VI_after__Init : ['1.202', '0.2041', '1.800', '0.1339', '1.800', '0.0813', '7.000', '0.7080', 1, 1, 1, 1, 1727288531.3804798]
VI_at__the_End : ['1.201', '0.4887', '1.800', '0.1352', '1.800', '0.1130', '7.000', '0.7087', 1, 1, 1, 1, 1727288592.1089418]