TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_23_41
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-016-013-15 | FUSED_ID : 6359364768406503647
  IC_TEMP :  -51.30 | VDDM : 1128.02 | AUX_INT :   -8.55 | CsaBias :   86.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20275e-03 / 2
  ADC_P0  : -8.55466e-03 ± 2.34756e-02
  ADC_P1  : 7.98317e-03 ± 5.43742e-04
  ADC_P2  : -5.49738e-06 ± 2.49993e-06
  CSA_Chi2/NDF : 6.18619e-05 / 2
  CSA_P0  : 5.68979e-02 ± 5.24607e-03
  CSA_P1  : 9.40851e-03 ± 3.95253e-04
  CSA_P2  : -3.64283e-05 ± 6.01924e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [62]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [9, 40]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3457', '1.800', '0.1304', '1.799', '0.0902', '7.000', '0.7081', 1, 1, 1, 1, 1727288620.739677]
VI_after__Init : ['1.202', '0.3459', '1.800', '0.1299', '1.800', '0.0857', '7.000', '0.7078', 1, 1, 1, 1, 1727288628.858026]
VI_at__the_End : ['1.202', '0.5022', '1.800', '0.1366', '1.800', '0.1092', '7.000', '0.7086', 1, 1, 1, 1, 1727288696.4319725]