TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_26_57
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-016-015-15 | FUSED_ID : 6359364768406503679
  IC_TEMP :  -55.26 | VDDM : 1120.77 | AUX_INT :   -8.24 | CsaBias :   94.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12887e-03 / 2
  ADC_P0  : -8.24293e-03 ± 2.27662e-02
  ADC_P1  : 7.93219e-03 ± 5.31665e-04
  ADC_P2  : -4.97807e-06 ± 2.46837e-06
  CSA_Chi2/NDF : 9.40547e-05 / 2
  CSA_P0  : 5.85300e-02 ± 6.46863e-03
  CSA_P1  : 9.56913e-03 ± 4.87365e-04
  CSA_P2  : -4.03074e-05 ± 7.42199e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [33]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2918', '1.800', '0.1358', '1.800', '0.0887', '7.000', '0.7081', 1, 1, 1, 1, 1727288816.6797206]
VI_after__Init : ['1.202', '0.2917', '1.800', '0.1358', '1.800', '0.0831', '7.000', '0.7079', 1, 1, 1, 1, 1727288825.4679656]
VI_at__the_End : ['1.202', '0.4956', '1.800', '0.1355', '1.800', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1727288882.9266]