TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_28_35
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-016-016-08 | FUSED_ID : 6359364768406503688
  IC_TEMP :  -54.98 | VDDM : 1127.55 | AUX_INT :   -8.41 | CsaBias :   89.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22380e-03 / 2
  ADC_P0  : -8.41483e-03 ± 2.36956e-02
  ADC_P1  : 8.26656e-03 ± 5.71057e-04
  ADC_P2  : -5.78014e-06 ± 2.72959e-06
  CSA_Chi2/NDF : 9.01087e-05 / 2
  CSA_P0  : 5.84521e-02 ± 6.33149e-03
  CSA_P1  : 9.74505e-03 ± 4.77032e-04
  CSA_P2  : -4.15893e-05 ± 7.26463e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [18, 19]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3501', '1.800', '0.1714', '1.800', '0.0969', '7.000', '0.7079', 1, 1, 1, 1, 1727288914.825162]
VI_after__Init : ['1.202', '0.3502', '1.800', '0.1714', '1.800', '0.0915', '7.000', '0.7078', 1, 1, 1, 1, 1727288922.8575358]
VI_at__the_End : ['1.201', '0.5040', '1.800', '0.1397', '1.800', '0.1112', '7.000', '0.7086', 1, 1, 1, 1, 1727288981.0831425]