TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_30_12
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-016-017-08 | FUSED_ID : 6359364768406503704
  IC_TEMP :  -55.55 | VDDM : 1113.26 | AUX_INT :   -7.23 | CsaBias :   81.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.11363e-04 / 2
  ADC_P0  : -7.23323e-03 ± 2.03902e-02
  ADC_P1  : 8.17870e-03 ± 4.82556e-04
  ADC_P2  : -6.12728e-06 ± 2.25112e-06
  CSA_Chi2/NDF : 9.84655e-05 / 2
  CSA_P0  : 5.65328e-02 ± 6.61857e-03
  CSA_P1  : 9.46645e-03 ± 4.98662e-04
  CSA_P2  : -3.88626e-05 ± 7.59403e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [2]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [12]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2450', '1.800', '0.1592', '1.800', '0.0876', '7.000', '0.7080', 1, 1, 1, 1, 1727289012.4746804]
VI_after__Init : ['1.202', '0.2449', '1.800', '0.1591', '1.800', '0.0824', '7.000', '0.7083', 1, 1, 1, 1, 1727289020.493102]
VI_at__the_End : ['1.202', '0.4969', '1.800', '0.1365', '1.800', '0.1102', '7.000', '0.7090', 1, 1, 1, 1, 1727289086.765007]