TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_35_06
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-016-020-08 | FUSED_ID : 6359364768406503752
  IC_TEMP :  -52.19 | VDDM : 1128.51 | AUX_INT :   -8.07 | CsaBias :   93.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03678e-03 / 2
  ADC_P0  : -8.07041e-03 ± 2.17801e-02
  ADC_P1  : 7.91194e-03 ± 5.02849e-04
  ADC_P2  : -5.29455e-06 ± 2.30187e-06
  CSA_Chi2/NDF : 7.73616e-05 / 2
  CSA_P0  : 5.79659e-02 ± 5.86658e-03
  CSA_P1  : 9.23024e-03 ± 4.42004e-04
  CSA_P2  : -3.50375e-05 ± 6.73121e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [33, 85, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0891', '1.800', '0.1352', '1.800', '0.0820', '7.000', '0.7081', 1, 1, 1, 1, 1727289306.1061387]
VI_after__Init : ['1.202', '0.0891', '1.800', '0.1353', '1.799', '0.0764', '7.000', '0.7079', 1, 1, 1, 1, 1727289314.9094665]
VI_at__the_End : ['1.202', '0.4987', '1.800', '0.1358', '1.800', '0.1101', '7.000', '0.7087', 1, 1, 1, 1, 1727289380.6404626]