TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_39_52
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-016-023-08 | FUSED_ID : 6359364768406503800
  IC_TEMP :  -52.93 | VDDM : 1124.77 | AUX_INT :  -25.38 | CsaBias :   57.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52602e-03 / 2
  ADC_P0  : -2.53812e-02 ± 2.74520e-02
  ADC_P1  : 8.32865e-03 ± 6.53857e-04
  ADC_P2  : -5.86003e-06 ± 3.07978e-06
  CSA_Chi2/NDF : 1.10812e-04 / 2
  CSA_P0  : 5.65162e-02 ± 7.02126e-03
  CSA_P1  : 9.83372e-03 ± 5.29001e-04
  CSA_P2  : -4.24391e-05 ± 8.05607e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [24, 79, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1290', '1.800', '0.0890', '1.800', '0.0831', '7.000', '0.7091', 1, 1, 1, 1, 1727289592.3252828]
VI_after__Init : ['1.202', '0.1290', '1.800', '0.0890', '1.802', '0.0758', '7.000', '0.7079', 1, 1, 1, 1, 1727289600.3676674]
VI_at__the_End : ['1.201', '0.5039', '1.800', '0.1349', '1.800', '0.1132', '7.000', '0.7089', 1, 1, 1, 1, 1727289658.485143]