TEST_NAME : Wafer
TEST_DATE : 24_09_25-21_02_34
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-017-009-02 | FUSED_ID : 6359364768406507666
  IC_TEMP :  -54.62 | VDDM : 1132.62 | AUX_INT : -114.02 | CsaBias :    2.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24443e-03 / 2
  ADC_P0  : -1.14016e-01 ± 2.92932e-02
  ADC_P1  : 9.81875e-03 ± 6.80357e-04
  ADC_P2  : -1.11931e-05 ± 3.09042e-06
  CSA_Chi2/NDF : 1.01430e-04 / 2
  CSA_P0  : 5.83124e-02 ± 6.71748e-03
  CSA_P1  : 9.58814e-03 ± 5.06114e-04
  CSA_P2  : -3.97161e-05 ± 7.70751e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [25, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2533', '1.800', '0.1450', '1.799', '0.0949', '7.000', '0.7079', 1, 1, 1, 1, 1727290954.3218186]
VI_after__Init : ['1.202', '0.2536', '1.800', '0.1450', '1.800', '0.0895', '7.000', '0.7081', 1, 1, 1, 1, 1727290962.3421433]
VI_at__the_End : ['1.202', '0.5011', '1.800', '0.1363', '1.800', '0.1137', '7.000', '0.7085', 1, 1, 1, 1, 1727291028.080181]