TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_59_18
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-017-011-02 | FUSED_ID : 6359364768406507698
  IC_TEMP :  -62.56 | VDDM : 1121.53 | AUX_INT :   -8.55 | CsaBias :   73.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13422e-03 / 2
  ADC_P0  : -8.55093e-03 ± 2.27540e-02
  ADC_P1  : 8.29152e-03 ± 5.39122e-04
  ADC_P2  : -6.45607e-06 ± 2.52830e-06
  CSA_Chi2/NDF : 1.28334e-04 / 2
  CSA_P0  : 5.93504e-02 ± 7.55603e-03
  CSA_P1  : 9.99835e-03 ± 5.69292e-04
  CSA_P2  : -4.71852e-05 ± 8.66965e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [84, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1235', '1.800', '0.1535', '1.800', '0.0865', '7.000', '0.7087', 1, 1, 1, 1, 1727290758.6608047]
VI_after__Init : ['1.202', '0.1235', '1.800', '0.1533', '1.800', '0.0795', '7.000', '0.7077', 1, 1, 1, 1, 1727290766.8232286]
VI_at__the_End : ['1.202', '0.4962', '1.800', '0.1352', '1.800', '0.1137', '7.000', '0.7090', 1, 1, 1, 1, 1727290835.5479596]