TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_57_41
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-017-012-02 | FUSED_ID : 6359364768406507714
  IC_TEMP :  -47.32 | VDDM : 1118.86 | AUX_INT :   -6.05 | CsaBias :   91.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36179e-03 / 2
  ADC_P0  : -6.05119e-03 ± 2.50164e-02
  ADC_P1  : 7.59523e-03 ± 5.63123e-04
  ADC_P2  : -4.93153e-06 ± 2.48283e-06
  CSA_Chi2/NDF : 6.37271e-05 / 2
  CSA_P0  : 5.88915e-02 ± 5.32457e-03
  CSA_P1  : 9.13021e-03 ± 4.01168e-04
  CSA_P2  : -3.28957e-05 ± 6.10931e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2767', '1.800', '0.1286', '1.800', '0.0924', '7.000', '0.7080', 1, 1, 1, 1, 1727290660.532276]
VI_after__Init : ['1.202', '0.2767', '1.800', '0.1286', '1.800', '0.0869', '7.000', '0.7080', 1, 1, 1, 1, 1727290669.3436172]
VI_at__the_End : ['1.202', '0.5021', '1.800', '0.1352', '1.800', '0.1102', '7.000', '0.7086', 1, 1, 1, 1, 1727290734.2377722]