TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_56_03
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-017-013-02 | FUSED_ID : 6359364768406507730
  IC_TEMP :  -53.72 | VDDM : 1129.08 | AUX_INT :   -8.79 | CsaBias :   80.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40624e-03 / 2
  ADC_P0  : -8.79265e-03 ± 2.54291e-02
  ADC_P1  : 8.15407e-03 ± 6.05832e-04
  ADC_P2  : -5.51280e-06 ± 2.86522e-06
  CSA_Chi2/NDF : 1.09720e-04 / 2
  CSA_P0  : 5.93915e-02 ± 6.98658e-03
  CSA_P1  : 9.72535e-03 ± 5.26388e-04
  CSA_P2  : -4.06444e-05 ± 8.01627e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [47, 54, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2731', '1.800', '0.1520', '1.800', '0.0862', '7.000', '0.7078', 1, 1, 1, 1, 1727290562.8138483]
VI_after__Init : ['1.202', '0.2731', '1.800', '0.1520', '1.800', '0.0817', '7.000', '0.7081', 1, 1, 1, 1, 1727290570.79427]
VI_at__the_End : ['1.202', '0.5045', '1.800', '0.1393', '1.800', '0.1114', '7.000', '0.7089', 1, 1, 1, 1, 1727290639.197049]