TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_54_25
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-017-014-02 | FUSED_ID : 6359364768406507746
  IC_TEMP :  -50.97 | VDDM : 1122.69 | AUX_INT :   -7.28 | CsaBias :   88.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22104e-03 / 2
  ADC_P0  : -7.27635e-03 ± 2.36782e-02
  ADC_P1  : 8.05883e-03 ± 5.62244e-04
  ADC_P2  : -5.22734e-06 ± 2.64714e-06
  CSA_Chi2/NDF : 5.64311e-05 / 2
  CSA_P0  : 5.72103e-02 ± 5.01050e-03
  CSA_P1  : 8.98470e-03 ± 3.77505e-04
  CSA_P2  : -3.27577e-05 ± 5.74896e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [0, 56]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [67]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3365', '1.799', '0.1445', '1.800', '0.0905', '7.000', '0.7090', 1, 1, 1, 1, 1727290464.9174006]
VI_after__Init : ['1.200', '0.3365', '1.799', '0.1444', '1.800', '0.0835', '7.000', '0.7080', 1, 1, 1, 1, 1727290473.0377123]
VI_at__the_End : ['1.202', '0.4906', '1.800', '0.1364', '1.801', '0.1113', '7.000', '0.7086', 1, 1, 1, 1, 1727290540.5115948]