TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_52_47
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-017-015-02 | FUSED_ID : 6359364768406507762
  IC_TEMP :  -61.45 | VDDM : 1119.95 | AUX_INT :   -7.98 | CsaBias :   72.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07621e-03 / 2
  ADC_P0  : -7.97616e-03 ± 2.21676e-02
  ADC_P1  : 8.11688e-03 ± 5.16084e-04
  ADC_P2  : -6.19039e-06 ± 2.37215e-06
  CSA_Chi2/NDF : 1.27880e-04 / 2
  CSA_P0  : 5.73183e-02 ± 7.54264e-03
  CSA_P1  : 9.85811e-03 ± 5.68283e-04
  CSA_P2  : -4.53768e-05 ± 8.65428e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [56]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1676', '1.800', '0.1175', '1.800', '0.0884', '7.000', '0.7080', 1, 1, 1, 1, 1727290366.9239151]
VI_after__Init : ['1.200', '0.1677', '1.800', '0.1175', '1.800', '0.0833', '7.000', '0.7080', 1, 1, 1, 1, 1727290374.9912894]
VI_at__the_End : ['1.202', '0.4959', '1.800', '0.1342', '1.799', '0.1134', '7.000', '0.7089', 1, 1, 1, 1, 1727290435.786545]