TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_51_08
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-017-016-05 | FUSED_ID : 6359364768406507781
  IC_TEMP :  -52.33 | VDDM : 1125.99 | AUX_INT :   -7.01 | CsaBias :   74.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.65834e-04 / 2
  ADC_P0  : -7.01448e-03 ± 1.98743e-02
  ADC_P1  : 8.18408e-03 ± 4.70348e-04
  ADC_P2  : -6.16244e-06 ± 2.19417e-06
  CSA_Chi2/NDF : 4.24374e-05 / 2
  CSA_P0  : 5.82552e-02 ± 4.34507e-03
  CSA_P1  : 9.07265e-03 ± 3.27370e-04
  CSA_P2  : -3.30898e-05 ± 4.98545e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [30, 35, 37, 40, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [20, 25, 48, 104, 108, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2950', '1.800', '0.1408', '1.800', '0.0867', '7.000', '0.7081', 1, 1, 1, 1, 1727290268.5574017]
VI_after__Init : ['1.202', '0.2950', '1.800', '0.1408', '1.799', '0.0810', '7.000', '0.7080', 1, 1, 1, 1, 1727290276.5828]
VI_at__the_End : ['1.201', '0.4959', '1.800', '0.1350', '1.800', '0.1098', '7.000', '0.7089', 1, 1, 1, 1, 1727290343.3606353]