TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_47_53
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-017-018-05 | FUSED_ID : 6359364768406507813
  IC_TEMP :  -55.26 | VDDM : 1124.27 | AUX_INT :   -7.45 | CsaBias :   82.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00834e-03 / 2
  ADC_P0  : -7.44801e-03 ± 2.14863e-02
  ADC_P1  : 8.20385e-03 ± 5.14455e-04
  ADC_P2  : -5.82228e-06 ± 2.43461e-06
  CSA_Chi2/NDF : 1.04640e-04 / 2
  CSA_P0  : 5.85815e-02 ± 6.82293e-03
  CSA_P1  : 9.67809e-03 ± 5.14059e-04
  CSA_P2  : -4.15496e-05 ± 7.82851e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [47]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1941', '1.800', '0.1519', '1.800', '0.0897', '7.000', '0.7089', 1, 1, 1, 1, 1727290073.2144246]
VI_after__Init : ['1.202', '0.1942', '1.800', '0.1519', '1.800', '0.0828', '7.000', '0.7079', 1, 1, 1, 1, 1727290082.020653]
VI_at__the_End : ['1.202', '0.5004', '1.800', '0.1341', '1.800', '0.1142', '7.000', '0.7089', 1, 1, 1, 1, 1727290140.9242022]