TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_46_16
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-017-019-05 | FUSED_ID : 6359364768406507829
  IC_TEMP :  -55.38 | VDDM : 1131.45 | AUX_INT :   -8.89 | CsaBias :   87.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26382e-03 / 2
  ADC_P0  : -8.89312e-03 ± 2.40792e-02
  ADC_P1  : 8.10682e-03 ± 5.70561e-04
  ADC_P2  : -5.37268e-06 ± 2.68868e-06
  CSA_Chi2/NDF : 9.54893e-05 / 2
  CSA_P0  : 6.01344e-02 ± 6.51778e-03
  CSA_P1  : 9.59702e-03 ± 4.91068e-04
  CSA_P2  : -3.83950e-05 ± 7.47838e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [85, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [11]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3249', '1.800', '0.1502', '1.799', '0.0873', '7.000', '0.7083', 1, 1, 1, 1, 1727289976.1377945]
VI_after__Init : ['1.202', '0.3251', '1.800', '0.1500', '1.801', '0.0816', '7.000', '0.7079', 1, 1, 1, 1, 1727289984.3992357]
VI_at__the_End : ['1.202', '0.5070', '1.800', '0.1380', '1.800', '0.1104', '7.000', '0.7089', 1, 1, 1, 1, 1727290051.7549393]