TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_44_38
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-017-020-05 | FUSED_ID : 6359364768406507845
  IC_TEMP :  -52.46 | VDDM : 1130.27 | AUX_INT :  -59.72 | CsaBias :   42.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50610e-03 / 2
  ADC_P0  : -5.97236e-02 ± 2.92201e-02
  ADC_P1  : 8.58841e-03 ± 6.69064e-04
  ADC_P2  : -7.19356e-06 ± 3.01118e-06
  CSA_Chi2/NDF : 7.37149e-05 / 2
  CSA_P0  : 5.75998e-02 ± 5.72664e-03
  CSA_P1  : 9.21109e-03 ± 4.31461e-04
  CSA_P2  : -3.37034e-05 ± 6.57064e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [4, 10, 20, 55]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1120', '1.800', '0.0841', '1.799', '0.0811', '7.000', '0.7079', 1, 1, 1, 1, 1727289878.2131917]
VI_after__Init : ['1.202', '0.1120', '1.800', '0.0841', '1.799', '0.0754', '7.000', '0.7079', 1, 1, 1, 1, 1727289886.3107631]
VI_at__the_End : ['1.202', '0.5011', '1.800', '0.1363', '1.800', '0.1107', '7.000', '0.7090', 1, 1, 1, 1, 1727289944.9672368]