TEST_NAME : Wafer
TEST_DATE : 24_09_25-20_41_30
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-017-022-05 | FUSED_ID : 6359364768406507877
  IC_TEMP :  -56.67 | VDDM : 1124.39 | AUX_INT :   -8.57 | CsaBias :   86.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38405e-03 / 2
  ADC_P0  : -8.57051e-03 ± 2.52369e-02
  ADC_P1  : 7.96704e-03 ± 5.92499e-04
  ADC_P2  : -5.04052e-06 ± 2.76054e-06
  CSA_Chi2/NDF : 9.07800e-05 / 2
  CSA_P0  : 5.84191e-02 ± 6.35503e-03
  CSA_P1  : 9.51589e-03 ± 4.78805e-04
  CSA_P2  : -3.65314e-05 ± 7.29164e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [57]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2325', '1.800', '0.1376', '1.800', '0.0905', '7.000', '0.7090', 1, 1, 1, 1, 1727289689.685763]
VI_after__Init : ['1.202', '0.2325', '1.800', '0.1376', '1.800', '0.0835', '7.000', '0.7079', 1, 1, 1, 1, 1727289698.3911335]
VI_at__the_End : ['1.201', '0.5095', '1.800', '0.1387', '1.800', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1727289757.1895258]