TEST_NAME : Wafer
TEST_DATE : 24_09_25-21_07_28
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-018-009-12 | FUSED_ID : 6359364768406511772
  IC_TEMP :  -57.65 | VDDM : 1126.59 | AUX_INT :  -95.42 | CsaBias :   29.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64811e-03 / 2
  ADC_P0  : -9.54211e-02 ± 3.24670e-02
  ADC_P1  : 9.74117e-03 ± 7.64652e-04
  ADC_P2  : -1.09164e-05 ± 3.53577e-06
  CSA_Chi2/NDF : 8.14408e-05 / 2
  CSA_P0  : 5.79185e-02 ± 6.01926e-03
  CSA_P1  : 9.28722e-03 ± 4.53508e-04
  CSA_P2  : -3.50271e-05 ± 6.90639e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [30, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1643', '1.800', '0.1131', '1.800', '0.0859', '7.000', '0.7076', 1, 1, 1, 1, 1727291248.55632]
VI_after__Init : ['1.202', '0.1644', '1.799', '0.1131', '1.800', '0.0805', '7.000', '0.7076', 1, 1, 1, 1, 1727291256.6555789]
VI_at__the_End : ['1.202', '0.5017', '1.800', '0.1355', '1.802', '0.1127', '7.000', '0.7083', 1, 1, 1, 1, 1727291315.3361623]