TEST_NAME : Wafer
TEST_DATE : 24_09_25-21_10_44
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-018-011-12 | FUSED_ID : 6359364768406511804
  IC_TEMP :  -51.50 | VDDM : 1120.96 | AUX_INT :   -7.60 | CsaBias :   89.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12270e-03 / 2
  ADC_P0  : -7.60355e-03 ± 2.27363e-02
  ADC_P1  : 8.15168e-03 ± 5.55609e-04
  ADC_P2  : -4.78243e-06 ± 2.69517e-06
  CSA_Chi2/NDF : 1.04892e-04 / 2
  CSA_P0  : 5.92910e-02 ± 6.83116e-03
  CSA_P1  : 9.68052e-03 ± 5.14678e-04
  CSA_P2  : -4.07067e-05 ± 7.83794e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3701', '1.800', '0.1228', '1.800', '0.0863', '7.000', '0.7079', 1, 1, 1, 1, 1727291444.4593482]
VI_after__Init : ['1.202', '0.3701', '1.799', '0.1227', '1.800', '0.0805', '7.000', '0.7074', 1, 1, 1, 1, 1727291452.5156126]
VI_at__the_End : ['1.202', '0.5018', '1.800', '0.1368', '1.800', '0.1125', '7.000', '0.7082', 1, 1, 1, 1, 1727291512.73599]