TEST_NAME : Wafer
TEST_DATE : 24_09_25-21_12_22
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-018-012-12 | FUSED_ID : 6359364768406511820
  IC_TEMP :  -55.74 | VDDM : 1127.72 | AUX_INT :   -7.79 | CsaBias :   81.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03439e-03 / 2
  ADC_P0  : -7.79463e-03 ± 2.17687e-02
  ADC_P1  : 8.18500e-03 ± 5.22864e-04
  ADC_P2  : -5.54262e-06 ± 2.48792e-06
  CSA_Chi2/NDF : 1.24637e-04 / 2
  CSA_P0  : 6.06328e-02 ± 7.44639e-03
  CSA_P1  : 9.96447e-03 ± 5.61032e-04
  CSA_P2  : -4.42360e-05 ± 8.54385e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2842', '1.800', '0.1332', '1.799', '0.0856', '7.000', '0.7078', 1, 1, 1, 1, 1727291542.6188748]
VI_after__Init : ['1.202', '0.2841', '1.800', '0.1332', '1.800', '0.0805', '7.000', '0.7074', 1, 1, 1, 1, 1727291550.6772509]
VI_at__the_End : ['1.202', '0.5089', '1.800', '0.1394', '1.799', '0.1134', '7.000', '0.7081', 1, 1, 1, 1, 1727291610.4845743]