TEST_NAME : Wafer
TEST_DATE : 24_09_25-21_14_00
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-018-013-12 | FUSED_ID : 6359364768406511836
  IC_TEMP :  -53.60 | VDDM : 1130.56 | AUX_INT :  -72.56 | CsaBias :   17.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.70408e-03 / 2
  ADC_P0  : -7.25554e-02 ± 3.16567e-02
  ADC_P1  : 9.11189e-03 ± 7.31431e-04
  ADC_P2  : -8.97180e-06 ± 3.32948e-06
  CSA_Chi2/NDF : 9.14646e-05 / 2
  CSA_P0  : 5.88550e-02 ± 6.37894e-03
  CSA_P1  : 9.56204e-03 ± 4.80607e-04
  CSA_P2  : -3.96848e-05 ± 7.31908e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [4, 35]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3445', '1.800', '0.1288', '1.800', '0.0927', '7.000', '0.7072', 1, 1, 1, 1, 1727291640.3813891]
VI_after__Init : ['1.201', '0.3445', '1.800', '0.1286', '1.802', '0.0874', '7.000', '0.7074', 1, 1, 1, 1, 1727291648.504694]
VI_at__the_End : ['1.202', '0.5004', '1.800', '0.1357', '1.800', '0.1119', '7.000', '0.7080', 1, 1, 1, 1, 1727291714.719627]