TEST_NAME : Wafer
TEST_DATE : 24_09_25-21_15_38
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-018-014-12 | FUSED_ID : 6359364768406511852
  IC_TEMP :  -54.35 | VDDM : 1128.91 | AUX_INT :   -8.09 | CsaBias :   72.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19756e-03 / 2
  ADC_P0  : -8.08794e-03 ± 2.34495e-02
  ADC_P1  : 8.06996e-03 ± 5.56813e-04
  ADC_P2  : -5.27363e-06 ± 2.62158e-06
  CSA_Chi2/NDF : 1.13743e-04 / 2
  CSA_P0  : 5.97994e-02 ± 7.11352e-03
  CSA_P1  : 9.67269e-03 ± 5.35952e-04
  CSA_P2  : -4.04018e-05 ± 8.16192e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [1, 56, 78]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1507', '1.800', '0.1926', '1.800', '0.0828', '7.000', '0.7071', 1, 1, 1, 1, 1727291738.3978586]
VI_after__Init : ['1.201', '0.1507', '1.799', '0.1926', '1.802', '0.0772', '7.000', '0.7073', 1, 1, 1, 1, 1727291746.5381753]
VI_at__the_End : ['1.202', '0.5039', '1.799', '0.1390', '1.799', '0.1107', '7.000', '0.7081', 1, 1, 1, 1, 1727291813.8050086]