TEST_NAME : Wafer
TEST_DATE : 24_09_30-11_53_10
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-035-002-010-01 | FUSED_ID : 6359364768409591969
  IC_TEMP : -111.61 | VDDM : 1069.01 | AUX_INT :  -13.89 | CsaBias :   40.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.13518e-03 / 2
  ADC_P0  : -1.38928e-02 ± 3.79933e-02
  ADC_P1  : 9.13463e-03 ± 1.00538e-03
  ADC_P2  : -5.73658e-06 ± 5.43122e-06
  CSA_Chi2/NDF : 7.80215e-05 / 2
  CSA_P0  : 5.79044e-02 ± 5.89155e-03
  CSA_P1  : 1.03046e-02 ± 4.43886e-04
  CSA_P2  : -8.03334e-05 ± 6.75985e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [31, 72, 112, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3323', '1.800', '0.1704', '1.800', '0.1030', '7.000', '0.7095', 1, 1, 1, 1, 1727689989.714483]
VI_after__Init : ['1.202', '0.3346', '1.800', '0.1719', '1.800', '0.0948', '7.000', '0.7081', 1, 1, 1, 1, 1727689998.1569288]
VI_at__the_End : ['1.194', '0.3792', '1.800', '0.1338', '1.800', '0.1232', '7.000', '0.7089', 1, 1, 1, 1, 1727690062.4651616]